Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
1. 1 Introduction - p. 2 2. 2 Basics of Quantum Information - p. 17 3. 3 Entanglement in Electron Optics of Atoms - p. 41 4. 4 Entanglement in Electron Optics of Molecules - p. 123 5. 5 Conclusions - p. 130 6. Acknowledgments - p. 133 7. Appendix A Some of the Well-Known Bipartite and Tripartite States of Qubits and Their Important Properties - p. 133 8. Appendix B Density Matrices for Coulombic Entanglement Generated in Some of the Processes (4)–(9) - p. 138 9. Appendix C Density Matrices for Fine-Structure Entanglement Generated in Some of the Processes (4)–(9) - p. 148 10. Chapter Two: Voltage Contrast Modes in a Scanning Electron Microscope and Their Application - p. 127 11. Abstract - p. 165 12. 1 Introduction - p. 166 13. 2 Sensitivity and Transfer Function of Potential Relief Measurements in a SEM - p. 168 14. 3 Method of Field Contrast (Trajectory Sensitive Contrast Technique) - p. 175 15. 4 The Potential Contrast Methods - p. 184 16. 5 Methods of Eliminating Factors Contributing to the Measurement Errors of Local Potential and the Resolution Deterioration - p. 196 17. 6 Fundamentals of Dynamic Potential Contrast Methods and Their Applications - p. 216 18. 7 Measurements Using Potential Contrast in a SEM - p. 231 19. 8 Conclusions and Outlook - p. 241 20. Chapter Three: WITHDRAWN: A Review of Scanning Electron Microscopy in Near Field Emission Mode - p. e1 21. Index - p. 327 22. Contents of Volumes 151-195 - p. 335
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
1. 1 Introduction - p. 2 2. 2 Basics of Quantum Information - p. 17 3. 3 Entanglement in Electron Optics of Atoms - p. 41 4. 4 Entanglement in Electron Optics of Molecules - p. 123 5. 5 Conclusions - p. 130 6. Acknowledgments - p. 133 7. Appendix A Some of the Well-Known Bipartite and Tripartite States of Qubits and Their Important Properties - p. 133 8. Appendix B Density Matrices for Coulombic Entanglement Generated in Some of the Processes (4)–(9) - p. 138 9. Appendix C Density Matrices for Fine-Structure Entanglement Generated in Some of the Processes (4)–(9) - p. 148 10. Chapter Two: Voltage Contrast Modes in a Scanning Electron Microscope and Their Application - p. 127 11. Abstract - p. 165 12. 1 Introduction - p. 166 13. 2 Sensitivity and Transfer Function of Potential Relief Measurements in a SEM - p. 168 14. 3 Method of Field Contrast (Trajectory Sensitive Contrast Technique) - p. 175 15. 4 The Potential Contrast Methods - p. 184 16. 5 Methods of Eliminating Factors Contributing to the Measurement Errors of Local Potential and the Resolution Deterioration - p. 196 17. 6 Fundamentals of Dynamic Potential Contrast Methods and Their Applications - p. 216 18. 7 Measurements Using Potential Contrast in a SEM - p. 231 19. 8 Conclusions and Outlook - p. 241 20. Chapter Three: WITHDRAWN: A Review of Scanning Electron Microscopy in Near Field Emission Mode - p. e1 21. Index - p. 327 22. Contents of Volumes 151-195 - p. 335
