Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians
1. 1. Introduction 2. 2. The Magnetolithography Method 3. 3. Patterning of Non-Flat Surfaces 4. 4. Summary and Future Perspective 5. Acknowledgments 6. The Optics of Spatial Coherence Wavelets 7. 1. Introduction 8. 2. Basic Concepts and Mathematical Formalism 9. 3. Interference and Diffraction with Scalar Wavelets 10. 4. Tensor Wavelets and Electromagnetic Fields 11. Acknowledgments 12. Common Diffraction Integral Calculation Based on a Fast Fourier Transform Algorithm 13. 1. Introduction 14. 2. Relation Between Discrete Fourier Transform and Fourier Transform 15. 3. Fast Fourier Transform of Fresnel Diffraction 16. 4. Numerical Integration of Classic Diffraction 17. 5. The Collins Formula and Its Inverse Operation 18. 6. Discussion and Conclusion 19. A Generalized Approach to Describe the Interference Contrast and the Phase Contrast Method 20. 1. Introduction 21. 2. The Interferometric Phase Contrast 22. 3. General Perspective of the Phase Contrast Method 23. 4. Conclusion 24. Nonlinear Partial Differential Equations for Noise Problems 25. 1. Introduction 26. 2. Noises and Filters 27. 3. Methods Based on Nonlinear Partial Differential Equations 28. 4. Relation of Functionals 29. Acknowledgment 30. Harmuth Corrigenda 31. 1. Introduction 32. Contents of previous volume
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians
1. 1. Introduction 2. 2. The Magnetolithography Method 3. 3. Patterning of Non-Flat Surfaces 4. 4. Summary and Future Perspective 5. Acknowledgments 6. The Optics of Spatial Coherence Wavelets 7. 1. Introduction 8. 2. Basic Concepts and Mathematical Formalism 9. 3. Interference and Diffraction with Scalar Wavelets 10. 4. Tensor Wavelets and Electromagnetic Fields 11. Acknowledgments 12. Common Diffraction Integral Calculation Based on a Fast Fourier Transform Algorithm 13. 1. Introduction 14. 2. Relation Between Discrete Fourier Transform and Fourier Transform 15. 3. Fast Fourier Transform of Fresnel Diffraction 16. 4. Numerical Integration of Classic Diffraction 17. 5. The Collins Formula and Its Inverse Operation 18. 6. Discussion and Conclusion 19. A Generalized Approach to Describe the Interference Contrast and the Phase Contrast Method 20. 1. Introduction 21. 2. The Interferometric Phase Contrast 22. 3. General Perspective of the Phase Contrast Method 23. 4. Conclusion 24. Nonlinear Partial Differential Equations for Noise Problems 25. 1. Introduction 26. 2. Noises and Filters 27. 3. Methods Based on Nonlinear Partial Differential Equations 28. 4. Relation of Functionals 29. Acknowledgment 30. Harmuth Corrigenda 31. 1. Introduction 32. Contents of previous volume
