Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.
1. Chapter One: Introduction - p. 1 2. Chapter Two: Statistical parameter estimation theory: principles and simulation studies - p. 29 3. Abstract - p. 29 4. 2.1 Introduction - p. 33 5. 2.2 Theory - p. 32 6. 2.3 Exit wave reconstruction: precise measurements of atomic column positions - p. 42 7. 2.4 ADF STEM: accurate and precise measurements of the scattering cross-sections and atomic column positions - p. 54 8. 2.5 ABF-ADF STEM: simultaneous model fitting - p. 66 9. 2.6 Conclusions - p. 70 10. Acknowledgements - p. 72 11. References - p. 72 12. Chapter Three: Efficient fitting algorithm - p. 73 13. Chapter Four: Atom counting - p. 91 14. Abstract - p. 91 15. 4.1 Statistics-based atom counting: methodology, possibilities, and inherent limitations - p. page91 16. 4.2 Practical applications: nanoparticle atom counting from experimental ADF STEM images - p. page116 17. Acknowledgements - p. 142 18. References - p. 144 19. Chapter Five: Optimal experiment design for nanoparticle atom counting from ADF STEM images - p. 145 20. Chapter Six: Atom column detection - p. 177 21. Abstract - p. 177 22. 6.1 Introduction - p. page177 23. 6.2 Bayes' theorem - p. 180 24. 6.3 Maximum a posteriori probability for ADF STEM - p. 183 25. 6.4 Atom column detection from experimental ADF STEM images - p. 193 26. 6.5 Maximum a posteriori probability for ABF-ADF STEM - p. 207 27. 6.6 Atom column detection from experimental ABF-ADF STEM images - p. 209 28. 6.7 Conclusions - p. 213 29. Acknowledgements - p. 214 30. References - p. 214 31. Chapter Seven: Image-quality evaluation and model selection with maximum a posteriori probability - p. 215 32. Chapter Eight: General conclusions and future perspectives - p. 243 33. References - p. 253 34. Index - p. 253
Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more.
1. Chapter One: Introduction - p. 1 2. Chapter Two: Statistical parameter estimation theory: principles and simulation studies - p. 29 3. Abstract - p. 29 4. 2.1 Introduction - p. 33 5. 2.2 Theory - p. 32 6. 2.3 Exit wave reconstruction: precise measurements of atomic column positions - p. 42 7. 2.4 ADF STEM: accurate and precise measurements of the scattering cross-sections and atomic column positions - p. 54 8. 2.5 ABF-ADF STEM: simultaneous model fitting - p. 66 9. 2.6 Conclusions - p. 70 10. Acknowledgements - p. 72 11. References - p. 72 12. Chapter Three: Efficient fitting algorithm - p. 73 13. Chapter Four: Atom counting - p. 91 14. Abstract - p. 91 15. 4.1 Statistics-based atom counting: methodology, possibilities, and inherent limitations - p. page91 16. 4.2 Practical applications: nanoparticle atom counting from experimental ADF STEM images - p. page116 17. Acknowledgements - p. 142 18. References - p. 144 19. Chapter Five: Optimal experiment design for nanoparticle atom counting from ADF STEM images - p. 145 20. Chapter Six: Atom column detection - p. 177 21. Abstract - p. 177 22. 6.1 Introduction - p. page177 23. 6.2 Bayes' theorem - p. 180 24. 6.3 Maximum a posteriori probability for ADF STEM - p. 183 25. 6.4 Atom column detection from experimental ADF STEM images - p. 193 26. 6.5 Maximum a posteriori probability for ABF-ADF STEM - p. 207 27. 6.6 Atom column detection from experimental ABF-ADF STEM images - p. 209 28. 6.7 Conclusions - p. 213 29. Acknowledgements - p. 214 30. References - p. 214 31. Chapter Seven: Image-quality evaluation and model selection with maximum a posteriori probability - p. 215 32. Chapter Eight: General conclusions and future perspectives - p. 243 33. References - p. 253 34. Index - p. 253
